Resolving the problem of GaN transistors unable to withstand voltage breakdown during abnormal circuit operation
By designing the breakdown voltage on the SiC side to be slightly lower than that on the GaN side in the hybrid type-transistor we produced, when the breakdown voltage of the SiC diode is exceeded, energy is released as heat on the SiC side, preventing overvoltage on the GaN side; a stable reversible breakdown behavior was confirmed for multiple sweeps. In addition, they were confirmed to have a high drain current of 300 mA/mm and a low on-resistance of 47 Ωmm because the current flows through two-dimensional electron gas in GaN with extremely high conductivity (mobility). In addition, since SiC has three times higher thermal conductivity than Si, excellent heat dissipation characteristics can be obtained with it.