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As the national metrology institute (NMI), we are focusing on the development and dissemination of measurement standards, promotion of measurement standards utilization, development of measurement technologies related to measurement standards, legal metrology work and training of experts. Our activity covers engineering, physical, material, and chemical measurement standards. It also covers development of measurement and analytical instrumentation. We also coordinate international activities on metrology standards as a national representative.
AIST has developed a defect detection technology that can easily detect atomic level defects in a large field of view of a transmission electron microscope image of crystal structures, by applying an image processing technique called the sampling Moiré method. The Moiré fringe pattern can be digitally generated from the atomic array image by treating the atomic arrangement as a grid. Dislocations can be easily detected from the Moiré fringe pattern because dislocations result in discontinuity in the Moiré fringes.
Schematic diagrams of the technology for visualizing dislocations from transmission electron microscope images
AIST has elucidated the emission mechanism of the materials for next-generation organic light-emitting diodes, namely thermally activated delayed fluorescent materials, using an advanced spectroscopic technique developed by AIST. The materials were designed and developed by Kyushu University. A group of molecules with high emission efficiency has a characteristic molecular structure. The spectroscopic technique used will be sophisticated further to observe the emission process in detail.
Schematics of conventional and elucidated emission mechanisms
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