Events

Core Electronics Technology Research Institute will hold its first symposium under the theme “Advanced Materials, Devices, and Inspection Technologies for Next-Generation Electronics.” The symposium will feature invited lectures on semiconductor inspection and metrology technologies and semiconductor devices based on topological magnetic materials. Researchers from our institute will also give presentations on topics including electron beam sources, EO imaging, superconducting materials, and terahertz technologies. In addition, the poster session will showcase the research activities and recent achievements of our research groups.
We welcome not only those interested in these research fields, but also anyone who would like to learn more about our research activities or explore opportunities for new research collaborations. We look forward to welcoming colleagues from across AIST.