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Research paper : National electrical standards supporting international competition of Japanese manufacturing industries (Y. Nakamura et al.)−221−Synthesiology - English edition Vol.3 No.3 (2010) introductory cost, commercially available measuring devices that were used widely in industry were employed in parts of the calibration system. Also, the system was designed to be used by clients (users) without special knowledge of calibration. For sending and receiving of the data and setting of the measurement conditions, particular care was taken for data protection and security measures to prevent intervention by the user. Also, the system allowed the remote calibration of all impedance standards (LCR standard) including inductance (L), AC resistance (R), and capacitance (C). Figure 13 shows the results of the demonstration experiment of the remote calibration using this system. The results were equivalent to those of the conventional carry-in calibration. Based on these results, we are investigating the practical use of the system, and are currently discussing the introduction of the remote calibration system with a Japanese electronic parts company. There are several thousand inspection meters for LCR parts at the production site of this company, and we expect to be able to provide the metrological traceability guarantee to all measuring devices through remote calibration. Also, active technological transfer and practical use are provided to other companies, to advance the quick dissemination of the capacitance standard to the industrial sites and to enable the establishment of the metrological traceability system.5 Future issuesA series of R&D were conducted to support the competitive power of the Japanese industry by developing the world’s top-level capacitance standard that is internationally compatible, and to establish the metrological traceability system by building the system for disseminating the standard to the industrial sites through the calibration labs. To present, three JCSS calibration labs are registered and accredited, and these labs are capable of conducting calibration in the range of 1 pF ~ 100 F. Thus the basic standard dissemination system was established. However, to establish the true metrological traceability system, it is necessary to build a system that can disseminate the standards needed at the sites of production quickly and at low cost. As one of the solutions, we considered the remote calibration system, and conducted R&D for the remote calibration system for the impedance standards (LCR standard) including the capacitance standard. While it has been technically demonstrated by experiment to be ready for practical use, to diffuse this system to industry, there are unsolved issues such as cost reduction of the system and the JCSS accreditation of the remote calibration method. However, a system that disseminates the national standard established by AIST to all the corners of industrial sites should be the issue in the future. We shall consider new methods of dissemination as well as the remote calibration method proposed in this paper, and the issue for the future is the establishment of a more efficient and rational metrological traceability system.Fig. 13 Experimental results of remote calibration (comparison to carry-in calibration)Remote calibrationCarry-in calibrationCalibration dates (2007)Capacitance (µF)0.10002000.10001000.10000500.10001500.10000000.09998000.09998500.09999000.0999950Aug 26Nov 14Oct 25Oct 5Sep 15Dec 4Japan Economic Center: ’10 Kondensa Gyokai No Jittai To Shorai Tembo (2010 State of the Capacitor Industry and Its Future Prospect), Japan Economic Center (2009) (in Japanese).H. Bachmair, T. Funck, R. Hanke and H. Lang: Realization and maintenance of the unit of capacitance with the PTB cross capacitor during the last ten Years, IEEE Trans. Instrum. Meas., 44, 440-442 (1995).G. Trapon, O. Thevenot, J. C. Lacueille and G. Geneves: Realization of the farad at BNM-LCIE, CPEM ’98 Conference Digest, 448-449 (1998).G. W. Small, B. W. Ricketts, P. C. Coogan, B. J. Pritchard and M. M. R. Sovierzoski: A new determination of the quantized Hall resistance in terms of the NML calculable cross capacitor, Metrologia, 34, 241-243 (1997).A. Jeffery, R. E. Elmquist, L. H. Lee, J. Q. Shields and R. F. Dziuba: NIST comparison of the quantized Hall resistance and the realization of the SI ohm through the calculable capacitor, IEEE Trans. Instrum. Meas., 46, 264-267 (1997).BIPM: Calibration and Measurement Capabilities - CMCs (Appendix C), The BIPM key comparison database (http://kcdb.bipm.org/AppendixC/default.asp) (2009).A. M. Thompson and D. G. Lampard: A new theorem in electrostatics and its application to calculable standards of capacitance, Nature, 177, 888 (1956).K. Shida, T. Wada, H. Nishinaka, M. Kobayashi, G. Yonezaki, T. Igarashi and T. Nemoto: Determination of the quantized Hall resistance value by using a calculable capacitor at ETL, IEEE Trans. Instrum. Meas., IM-36, 214-217 (1987).T. Endo: New electrical standards based on quantum effects - Josephson effect voltage standard and quantum Hall effects resistance standard, Oyo Butsuri (A Monthly Publication of The Japan Society of Applied Physics), 59, 712-724 (1990) (in Japanese).Y. Nakamura, A. Fukushima, Y. Sakamoto, T. Endo and G. W. Small: A multifrequency quadrature bridge for realization of the capacitance standard at ETL, IEEE Trans. Instrum. Meas., 48, 351-355 (1999).Y. Nakamura, M. Nakanishi and T. Endo: Measurement of frequency dependence of standard capacitors based on the QHR in the range between 1 kHz and 1.592 kHz, IEEE Trans. Instrum. Meas., 50, 290-293 (2001).Y. Nakamura: Measurement of frequency dependence of fused-silica standard capacitor, AIST Today, 3 (1), 17 (2003) (in Japanese).A. Domae, Y. Nakamura and Y. Ichikawa: Calibration of standard capacitors of 0.01 F - 1 F at NMIJ/AIST, CPEM [1][2][3][4][5][6][7][8][9][10][11][12][13]References

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