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Research paper : Innovative electron microscope for light-element atom visualization (Y.Sato et al.)−180−Synthesiology - English edition Vol.4 No.3 (2012) AuthorsYuta SatoRecieved his Ph.D. in energy science from Kyoto University in 2004. He joined AIST in 2004, and is currently a researcher of Nanotube Research Center, AIST. In this project, he is mainly in charge of application experiments of the low-voltage electron microscope.Takeo SasakiReceived his Ph.D. in materials engineering from the University of Tokyo in 2006. He joined JEOL Ltd. in 2006, and is currently a chief of EM Technical Group 1, EM Business Unit, JEOL. In this project, he is mainly in charge of performance examination and application experiments of the low-voltage electron microscopes.Hidetaka SawadaReceived his Ph.D. in materials engineering from the University of Tokyo in 2002. He joined JEOL Ltd. in 2002, and is currently a researcher of EM Technical Group 1, EM Business Unit, JEOL. In this project, he is mainly in charge of development and performance examination of the low-voltage electron microscopes.Fumio HosokawaRecieved his B.S. from Kyushu University in 1984. He joined JEOL Ltd. in 1984, and is currently a senior researcher of EM Technical Group 1, EM Business Unit, JEOL. His primary duty is to develop optical systems of transmission electron microscopes, especially aberration correctors. In this project, he is mainly in charge of designing the chromatic aberration corrector.Y. Sato, K. Suenaga, S. Okubo, T. Okazaki and S. Iijima: Structures of D5d-C80 and Ih-Er3N@C80 fullerenes and their rotation inside carbon nanotubes demonstrated by aberration-corrected electron microscopy, Nano Lett., 7, 3704-3708 (2007).Y. Sato, K. Yanagi, Y. Miyata, K. Suenaga, H. Kataura and S. Iijima: Chiral-angle distribution for separated single-walled carbon nanotubes, Nano Lett., 8, 3151-3154 (2008).http://www.busshitu.jst.go.jp/kadai/year03/team03.htmlB. Kabius, P. Hartel, M. Haider, H. Müller, S. Uhlemann, U. Loebau, J. Zach and H. Rose: First application of Cc-corrected imaging for high-resolution and energy-filtered TEM, J. Electron Microsc., 58, 147-155 (2009).H. Sawada, Y. Tanishiro, N. Ohashi, T. Tomita, F. Hosokawa, T. Kaneyama, Y. Kondo and K. Takayanagi: STEM imaging of 47-pm-separated atomic columns by a spherical aberration-corrected electron microscope with a 300-kV cold field emission gun, J. Electron Microsc., 58, 357-361 (2009).T. Sasaki, H. Sawada, F. Hosokawa, Y. Kohno, T. Tomita, T. Kaneyama, Y. Kondo, K. Kimoto, Y. Sato and K. Suenaga: Performance of low-voltage STEM/TEM with delta corrector and cold field emission gun, J. Electron Microsc., 59, S7-S13 (2010).H. Rose: Outline of a spherically corrected semiaplanatic medium-voltage transmission electron-microscope, Optik, 85, 19-24 (1990). M. Haider, S. Uhlemann, E. Schwan, H. Rose, B. Kabius and K. Urban: Electron microscopy image enhanced, Nature, 392, 768-769 (1998).F. Hosokawa, T. Sannomiya, H. Sawada, T. Kaneyama, Y. Kondo, M. Hori, S. Yuasa, M. Kawazoe, Y. Nakamichi, T. Tanishiro, N. Yamamoto and K. Takayanagi: Design and development of Cs corrector for a 300 kV TEM and STEM, Proc. IMC 16 (Sapporo), 582 (2006).H. Sawada, T. Sasaki, F. Hosokawa, S. Yuasa, M. Terao, M. Kawazoe, T. Nakamichi, T. Kaneyama, T. Tomita, Y. Kondo, K. Kimoto and K. Suenaga: Correction of higher order geometrical aberration by triple 3-fold astigmatism field, J. Electron. Microsc., 58, 341-347 (2009).H. Sawada, T. Sasaki, F. Hosokawa, S. Yuasa, M. Terao, M. Kawazoe, T. Nakamichi, T. Kaneyama, Y. Kondo, K. Kimoto and K. Suenaga: Higher-order aberration corrector for an image-forming system in a transmission electron microscope, Ultramicroscopy, 110, 958-961 (2010).H. Sawada, F. Hosokawa, T. Sasaki, T. Kaneyama, Y. Kondo and K. Suenaga: Aberration correctors developed under the Triple C project, in P. Hawkes (Ed.): Advances in Imaging and Electron Physics, 168, 297-336 (2011).F. Hosokawa, H. Sawada, T. Sasaki, Y. Kondo and K. Suenaga: Chromatic aberration correction of objective lens using a concave lens effect of a long quadrupole field, Proceedings of the 66th annual meeting of the Japanese Society of Microscopy (Nagoya), 14 (2010) (in Japanese).H. Sawada, F. Hosokawa, T. Sasaki, S. Yuasa, M. Kawazoe, M. Terao, T. Kaneyama, Y. Kondo, K. Kimoto and K. Suenaga: Chromatic aberration correction by combination concave lens, Microsc. Microanal., 16(S2), 116-117 (2010).K. Urita, Y. Sato, K. Suenaga, A. Gloter, A. Hashimoto, M. Ishida, T. Shimada, H. Shinohara and S. Iijima: Defect-induced atomic migration in carbon nanopeapod: Tracking the single-atom dynamic behavior, Nano Lett., 4, 2451-2454 (2004).Y. Sato, T. Yumura, K. Suenaga, K. Urita, H. Kataura, T. Kodama, H. Shinohara and S. Iijima: Correlation between atomic rearrangement on defective fullerenes and migration behaviors of encaged metal ions, Phys. Rev. B, 73, 233409 (4 pages) (2006).[6][7][8][9][10][11][12][13][14][15][16][17][18][19][20][21][22][23][24][25][26][27]K. Suenaga, M. Tencé, C. Mory, C. Colliex, H. Kato, T. Okazaki, H. Shinohara, K. Hirahara, S. Bandow and S. Iijima: Element-selective single atom imaging, Science, 290, 2280-2282 (2000).K. Suenaga, Y. Sato, Z. Liu, H. Kataura, T. Okazaki, K. Kimoto, H. Sawada, T. Sasaki, K. Omoto, T. Tomita, T. Kaneyama and Y. Kondo: Visualizing and identifying single atoms using electron energy-loss spectroscopy with low accelerating voltage, Nat. Chem., 1, 415-418 (2009).K. Suenaga and M. Koshino: Atom-by-atom spectroscopy at graphene edge, Nature, 468, 1088-1090 (2010).http://www.salve-project.de/http://ncem.lbl.gov/TEAM-project/http://www.superstem.org/

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