Update
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Titles
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Research Units
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01/07/2009
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 Visualization Technology for "Invisible" Danger
- Diagnosing damages in structures and their danger level at the same time using elastico-luminescent materials -
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Measurement Solution Research Center
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04/03/2006
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 Ultra-Sensitive Detection of Trace Amounts of Proteins Using Fluorescent Nano Particles
- Dramatic sensitivity enhancement of antibody-based protein detection by integration of fluorescent quantum dots -
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On-site Sensing and Diagnosis Research Laboratory
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04/13/2010
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 System for Precise Surface-temperature Monitoring of a Rapidly Heated and Cooled Wafer
- Non-contact, in situ measurement of temperature changes of a silicon wafer during heat treatment -
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Metrology Institute of Japan
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01/21/2005
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 Small-Sized Ozone Concentration Gauge to Cover Ultra-High Concentration
-Continuous Concentration Determination of Ozone Made Available -
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Research Institute of Instrumentation Frontier
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11/16/2009
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 Simultaneous Emission of Infrared and X-ray Beams Using a Compact Free Electron Laser System
- Prospective applications include a two-color light source of infrared light and X-ray with variable energy -
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Research Institute of Instrumentation Frontier
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02/15/2005
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 Remote Calibration of Length Standard by Using Optical Fiber Network
- Comparison of Block Gauges Separated by 47 kilometers -
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Metrology Institute of Japan
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12/19/2008
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Preparation of Composite Nitride Piezoelectric Thin Films with Large Piezoelectricity
-Towards application to vibration and pressure sensors in high-temperature environments -
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Measurement Solution Research Center
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10/18/2005
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 Portable Ultrasound Measures Muscles, Bones, and Subcutaneous Fat
- Health Checks with Echo Imagery -
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On-site Sensing and Diagnosis Research Laboratory
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05/09/2012
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 Opening the Way to a Redefinition of the Kilogram Based on Fundamental Physical Constants
- Successful improvement of the accuracy of the Avogadro constant -
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Metrology Institute of Japan
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09/21/2012
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 Intermolecular Space Evaluation Using Slow Positrons Extracted into the Atmosphere
- In-situ evaluation of functional thin films such as desalination membranes -
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Research Institute of Instrumentation Frontier
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06/16/2005
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 Installation of Noiseless Superconducting Detector Array for Mass Spectrometry
- Mass Spectrometer with 100 % Detection Efficiency for Atoms to Protein Molecules -
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Research Institute of Instrumentation Frontier
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02/02/2011
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 Inorganic Photochromic Materials Responding to Visible Light with Excellent Durability
– The materials reversibly become pink by blue light and colorless by green light –
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Measurement Solution Research Center
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07/31/2012
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 Highly Sensitive Detection of a High-molecular-weight Ion Using Nano-structured Superconductors
- Overcoming the limitations of existing mass spectrometers -
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Research Institute of Instrumentation Frontier
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04/01/2004
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 Flatness Measurement with World's Best Precision
- Providing Flatness Standards -
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Metrology Institute of Japan
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08/28/2006
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 First Success in 3D Visualization of Air-hydrates in Antarctic Ice
- Enabling the detection of global atmospheric variations over several hundred thousand years -
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Research Institute of Instrumentation Frontier
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07/17/2009
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 Fabrication of a Nanometer-sized Diamond Ruler
- Fundamental technology in the field of nanotechnology -
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Nanotechnology Research Institute
Metrology Institute of Japan
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04/13/2009
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 Establishment of the Mammography Dose Standard
- Towards achieving safe and secure breast cancer examination -
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Metrology Institute of Japan
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11/25/2010
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 Development of a New Material for the Negative Electrode of Lithium Ion Secondary Batteries
- Realization of high capacity through use of new titanium oxide -
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Advanced Manufacturing Research Institute
Research Institute of Instrumentation Frontier
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02/25/2008
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 Development of a National Standard-Level Voltage Generator Usable in Industry
- Desktop quantized voltage generator operable without liquid helium -
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Metrology Institute of Japan
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02/10/2012
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 Development of Technology for Measuring Static Electricity Using Sound Waves
- Visualization of static electricity distribution on flat surfaces -
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Measurement Solution Research Center
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