National Institute of Advanced Industrial Science and Technology (AIST)
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AIST TODAYNo.22 Autumn 2006 [ PDF:3.5MB ]


Time-of-Flight Mass Spectrometry with an Ion Attachment Ionization Technique


We have developed a new mass spectrometry based on a time-of-flight mass spectrometer combined with an ion attachment ionization technique (IA-TOF). An alkali ion attachment scheme can ionize organic molecules without producing fragment ions. The adduct ions distributing over a wide mass range can be investigated with a high mass resolution by time-of-flight mass spectrometers. A tabletop IA-TOF system was developed and applied to typical specimens in a gas-phase as well as in a solid-phase as a performance test. We have succeeded in a fragment-free ionization and a mass analysis with a high mass resolution over a wide mass range. The IA-TOF realizes an accurate and versatile real-time analysis.

Figure 1

Figure 2

Figure 1: A schematic view of the IA-TOF system.
Figure 2: Typical mass spectra of benzene (C6H6) diluted by N2 gas. We have succeeded in a fragment-free ionization and a mass measurement with a high mass resolution.

Relational Information

AIST TODAY Vol.6, No.8 (2006) p.28-29



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