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AIST TODAYNo.21 Summer 2006 [ PDF:4MB ]


Stable Operation of Carbon Nanotube Transistor


Carbon nanotube transistors, so far reported, had major problems such as a large time fluctuation of drain current and a large hysteresis characteristic. A cause of these fluctuations was found to be a photo-resist adhered to the surface of carbon nanotubes, as well as oxygen and water. New fabrication process for a carbon nanotube transistor was established in which the residue of the photo-resist as well as the water and oxygen never adhere to the carbon nanotubes. The new carbon nanotube transistor shows almost no fluctuation of the current and no hysteresis characteristic.

Figure
Figure : Carbon nanotube FET fabricated by the conventional process shows the large hysteresis characteristics of a few Volts. On the other hand, the carbon nanotube FET fabricated by our new process shows almost no hysteresis characteristic.

Relational Information
AIST TODAY Vol.6 , No.6 (2006) p.20-21


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