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AIST TODAYNo.17 Summer 2005 [ PDF:15.7MB ]


Development of SiC static induction transistors (SiC-SITs) with ultra-low power loss

Yasunori Tanaka
Power Electronics Research Center
e-mail address

A SiC-static induction transistors (SiC-SITs) with buried p+ gate regions by using hexagonal silicon carbide (4H-SiC) has been fabricated. The new SiC-SIT has breakdown voltage VBR 700 V and specific on-resistance RonS 1.01 mΩ·cm2, which is the smallest RonS in the world for switching devices of VBR 600 V~1.2 kV class. The SiC-SIT will reduce power loss extensively to 1/12 that of silicon insulated gate bipolar transistor (Si-IGBT).

Fig1
Fig2
Fig 1: A schematic diagram of newly developed buried gate type SiC-SIT.
 
Fig 2: A voltage-current curve of newly developed buried gate type SiC-SIT.

Relational Information

AIST Today Vol.5, No.6 (2005) p.34-35



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