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AIST TODAYNo.16 Spring 2005 [ PDF:17.6MB ]


4H-SiC Lateral RESURF MOSFETs

Mitsuo Okamoto
Power Electronics Research Center
e-mail address

We have developed lateral RESURF MOSFETs on 4H-SiC substrates, which has a great potential for SiC power ICs. The 4H-SiC MOS devices, however, had a serious problem that the on-resistance was too high due to its low channel mobility. We have overcome this problem by using 4H-SiC (000-1) C-face substrates. Blocking voltage Vbd of 450 V and specific on-resistance Rons of 49 mΩcm2 were obtained for the lateral RESURF MOSFET on a 4H-SiC C-face. The Rons for the C-face was improved to one thirtieth of the Si-face at the almost same Vbd.

Figure
Fig. Drain characteristics of the RESURF MOSFET fabricated on the 4H-SiC Si-face and C-face.

Relational Information

AIST Today Vol.5 , No.2 (2005-No.16) 25



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