Fault current limiter (FCL) device is one of the most promising applications of oxide superconducting thin films. In this type of device, the SN transition of superconducting films is utilized for the limitation of the accidental overcurrent. Therefore, the initial consideration in its thermal and mechanical design is inevitably needed for preventing it from breaking due to large thermal stress. We have developed a non-contact thermoreflectance technique to remotely measure thermal effusivity of thin films and applied the technique for the evaluation of YBCO thin films (0.8µm in thickness) on MgO substrate. The absolute value of thermal effusivity of the YBCO films is clearly confirmed to be comparable with those of bulk YBCO. This evaluation technique is also expected to be available for detection of defect points of large thin films by scanning probe laser beams.